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Metallurgical Microscope
Metallurgical Microscope
Multifunctional metallurgical microscope for microscopic structure observation and analysis of metals, non-metals and various materials. It is mainly used to observe microstructural characteristics of polished metallographic specimens, such as grain size, phase composition, inclusions, defects and surface morphology.
产品用途

1. Adopting the latest standard ICCS objective system and fitted with high-contrast, high-resolution EC (Enhanced Contrast) objectives, it utilizes high-refractive-index low-dispersion fluorite materials and special coating technology for sharper imaging and superior contrast. All objectives feature parfocal design, eliminating refocusing when switching magnifications for higher operational efficiency.

2. Supports hybrid eyepiece-camera observation mode, which delivers the flexibility of visual inspection while enabling simultaneous image capture and recording. It perfectly integrates observation with digital analysis for broader application scenarios.

3. Equipped with a 5-position objective turret to hold multiple objectives at once. Magnification switching is quick and smooth without frequent objective replacement, streamlining the specimen preparation and observation workflow.

4. The 50× and 100× high-magnification objectives feature retractable protection. When encountering uneven sample surfaces or improper operation, the objective front end retracts automatically to avoid collisions between the objective and the specimen, protecting costly objectives and preventing sample damage for worry-free operation.

5. Built-in ECO energy-saving mode automatically switches the unit to standby or turns off the light source after prolonged inactivity, greatly cutting power consumption and light source wear to extend equipment service life in an eco-friendly, hassle-free manner.

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产品详情
基础参数

1. Microstructure observation, grain size rating and phase composition analysis of various metals, ceramics, polymers and composite materials.

2. Inspection of surface defects, cracks, coating thickness and failure morphology for electronic components, PCBs, crystals, mineral samples and other specimens.

3. Matched with high-contrast and high-resolution objectives to support multiple observation modes including brightfield, darkfield and polarized light, meeting the demands of material research and quality inspection.

4. Hybrid eyepiece-camera function enables simultaneous micrograph capture. Quantitative measurement, data logging and report generation can be performed with supporting analysis software.

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Sanhao Instruments
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