1. Imaging resolution: 0.9nm at 15kV, 1.3nm at 1kV, 1.9nm at 500V. It delivers excellent contrast and fine detail under low voltage, suitable for observing damage-prone and non-conductive samples.
2. Imaging configuration: Magnification ranges from 10× to 1,000,000×. Integral averaging noise reduction is supported to output high-definition detailed images with outstanding signal-to-noise ratio.
3. Sample stage: 5-axis motorized adjustment with 125mm travel on X/Y axes. Compatible with large-size samples, featuring high rigidity and precise positioning for irregular and heavy specimens.
4. Operating modes: High vacuum and variable pressure modes are available for direct observation of conductive, non-conductive, magnetic and outgassing complex samples.
5. Analytical performance: Equipped with high-precision EDS geometric system for faster and more accurate imaging and composition analysis. Morphology, inclusion and phase identification can be completed on one single instrument.
