PRODUCT CENTER
PRODUCT CENTER
Atomic Force Microscope (AFM) / Scanning Probe Microscope (SPM)
X-ray Microscope
Non-destructive 3D micro-CT platform with two-stage magnification imaging architecture, breaking the resolution limit of traditional CT. It delivers submicron high-resolution 3D imaging for large samples without slicing or damaging specimens.
产品用途

1. Imaging precision: true spatial resolution of 500nm with a minimum voxel size of 40nm, balancing wide field of view and ultra-high resolution for excellent fine detail capture.

2. X-ray parameters: X-ray source voltage continuously adjustable from 30kV to 160kV with a maximum power of 10W, suitable for samples of varying densities including metals, non-metals and porous materials.

3. Imaging advantages: integrates absorption contrast and phase contrast imaging to clearly visualize microstructures of low-density and low-contrast specimens.

4. Sample compatibility: supports imaging at long working distances, enabling placement of intact large-size samples without cutting preparation to preserve the original sample structure.

5. Functional features: supports fast scanning and in-situ 4D (3D + time) dynamic observation, compatible with various dynamic mechanical and thermal experiments.

立即咨询:0755-27207716
产品详情
基础参数

1. Material industry: Non-destructive 3D analysis of metal pores, cracks, composite material interfaces, battery electrode structures, microstructures of polymers and concrete.

2. Semiconductor and electronics industry: 3D morphology inspection and failure tracing for device packaging, solder joints and micro defects.

3. Geology, mineral resources and paleontology: 3D characterization of rock and ore pore structures, mineral distribution and fossil microstructures.

4. Life science: Non-invasive 3D microscopic imaging of animal and plant soft tissues and biological tissues, supporting in-situ dynamic experimental analysis.

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Sanhao Instruments
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